Invention Grant
- Patent Title: Image analysis method, image analysis device, image analysis system, and storage medium
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Application No.: US16766333Application Date: 2018-11-05
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Publication No.: US11321841B2Publication Date: 2022-05-03
- Inventor: Kazuaki Nakane , Hirofumi Yamamoto , Mizuho Nishio
- Applicant: OSAKA UNIVERSITY
- Applicant Address: JP Osaka
- Assignee: OSAKA UNIVERSITY
- Current Assignee: OSAKA UNIVERSITY
- Current Assignee Address: JP Osaka
- Agency: Kagan Binder, PLLC
- Priority: JPJP2017-226260 20171124
- International Application: PCT/JP2018/040977 WO 20181105
- International Announcement: WO2019/102829 WO 20190531
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/187 ; G06T7/136 ; G06T7/11 ; A61B5/00 ; A61B6/03

Abstract:
In order to assess, with high accuracy, a degree of a change having occurred in a structure, the present invention includes: a Betti number calculating section (42) configured to (I) generate, with respect to a single captured image obtained by capturing an image of a structure, a plurality of binarized images having respective binarization reference values different from each other and (II) calculate, for each of the plurality of binarized images, a first characteristic numerical value indicative of the number of connected regions each of which is obtained by connecting pixels each having one of pixel values obtained by binarization; and a prediction score determining section (44) configured to determine, in accordance with a result of a comparison, information on a change having occurred in the structure, the comparison having been made between (i) a pattern indicative of a relationship between (a) the respective binarization reference values and (b) the first characteristic numerical value and (ii) a predetermined reference pattern.
Public/Granted literature
- US20200372649A1 IMAGE ANALYSIS METHOD, IMAGE ANALYSIS DEVICE, IMAGE ANALYSIS SYSTEM, AND STORAGE MEDIUM Public/Granted day:2020-11-26
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