发明授权
- 专利标题: Circuit for generating multi-phase clock having random disturbance added thereto
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申请号: US17257315申请日: 2018-12-13
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公开(公告)号: US11323129B2公开(公告)日: 2022-05-03
- 发明人: Jie Pu , Gangyi Hu , Dongbing Fu , Zhengping Zhang , Liang Li , Ting Li , Daiguo Xu , Mingyuan Xu , Xiaofeng Shen , Xianjie Wan , Youhua Wang
- 申请人: NO.24 RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- 申请人地址: CN Chongqing
- 专利权人: NO.24 RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- 当前专利权人: NO.24 RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- 当前专利权人地址: CN Chongqing
- 优先权: CN201810821512.2 20180724
- 国际申请: PCT/CN2018/120792 WO 20181213
- 国际公布: WO2020/019633 WO 20200130
- 主分类号: H03M1/12
- IPC分类号: H03M1/12 ; G06F1/10 ; H03M1/06
摘要:
The present disclosure provides a circuit for generating a multi-phase clock having random disturbance added thereto. The circuit for generating a clock includes a main clock module, a random signal generation module and a buffer matrix switch module. The main clock module generates N multi-phase clock signals; and the buffer matrix switch module randomly switches, under the control of a random control signal output by the random signal generation module, transmission paths of the input N multi-phase clock signals, and outputs N multi-phase clock signals with random disturbance. In the present disclosure, the clock phase error is whitened by adding random disturbance. Only with a small loss of signal-to-noise ratio, the influence of a multi-phase clock phase error on the performance of a high-precision TI ADC can be eliminated in real time, and the influence of the fluctuation of a clock phase error can be tracked and eliminated.
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