Invention Grant
- Patent Title: Surveying instrument
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Application No.: US16398354Application Date: 2019-04-30
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Publication No.: US11333496B2Publication Date: 2022-05-17
- Inventor: Fumio Ohtomo , Kaoru Kumagai , Tetsuji Anai
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JPJP2018-088254 20180501
- Main IPC: G01C15/00
- IPC: G01C15/00 ; G01S17/08 ; G01S17/89 ; G01S7/481 ; G01S7/486 ; G01S7/51 ; G01B11/26 ; G01S7/4861

Abstract:
A surveying instrument comprises a monopod installed on a reference point, a surveying instrument main body provided at a known distance from a lower end of the monopod and at a known angle with respect to an axis of the monopod and having a reference optical axis, wherein the surveying instrument main body performs an image pickup of an object to be measured and scans the object to be measured by a closed loop scan pattern respectively at a pre-rotation and a post-rotation of the surveying instrument main body, obtains cross points of a locus of a scan pattern of the pre-rotation and the post-rotation, obtains deflection angles of the cross point with respect to the reference optical axis of the pre-rotation and the post-rotation, and calculates a rotation angle of the surveying instrument main body based on a deviation between both of the deflection angles.
Public/Granted literature
- US20190339075A1 Surveying Instrument Public/Granted day:2019-11-07
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