Invention Grant
- Patent Title: Cleaning a structure surface in an EUV chamber
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Application No.: US16961747Application Date: 2019-02-12
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Publication No.: US11347154B2Publication Date: 2022-05-31
- Inventor: Chunguang Xia , Jonghoon Baek , John Tom Stewart, IV , Andrew David LaForge , Deniz Van Heijnsbergen , David Robert Evans , Nina Vladimirovna Dziomkina , Yue Ma
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: DiBerardino McGovern IP Group LLC
- International Application: PCT/EP2019/053350 WO 20190212
- International Announcement: WO2019/158492 WO 20190822
- Main IPC: G03F7/20
- IPC: G03F7/20 ; H01J37/32 ; H05G2/00 ; H05H1/46

Abstract:
In some general aspects, a surface of a structure within a chamber of an extreme ultraviolet (EUV) light source is cleaned using a method. The method includes generating a plasma state of a material that is present at a location adjacent to a non-electrically conductive body that is within the chamber. The generation of the plasma state of the material includes electromagnetically inducing an electric current at the location adjacent the non-electrically conductive body to thereby transform the material that is adjacent the non-electrically conductive body from a first state into the plasma state. The plasma state of the material includes plasma particles, at least some of which are free radicals of the material. The method also includes enabling the plasma particles to pass over the structure surface to remove debris from the structure surface without removing the structure from the chamber of the EUV light source.
Public/Granted literature
- US20210063899A1 CLEANING A STRUCTURE SURFACE IN AN EUV CHAMBER Public/Granted day:2021-03-04
Information query
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