- 专利标题: Method for testing a device under test
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申请号: US17134806申请日: 2020-12-28
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公开(公告)号: US11353510B1公开(公告)日: 2022-06-07
- 发明人: Jerry E. Stevens , Hao Zhu , Marcel Braun
- 申请人: Endress+Hauser Flowtec AG
- 申请人地址: CH Reinach
- 专利权人: Endress+Hauser Flowtec AG
- 当前专利权人: Endress+Hauser Flowtec AG
- 当前专利权人地址: CH Reinach
- 代理机构: Endress+Hauser (USA) Holding Inc.
- 代理商 Christopher R. Powers
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G01R31/319
摘要:
A method for testing a device under test, the device under test being a measuring instrument to measure a physical parameter of a fluid, includes: performing a plurality of valid test runs, wherein a valid test run includes: exposing the device under test and a reference measuring instrument to the fluid under a set of influences, the set of influences being defined by influence parameters; monitoring the influence parameters; obtaining a reference value for the physical parameter from the reference measuring instrument; and obtaining a test value for the physical parameter from the device under test, wherein a test run is invalidated if influence parameters do not meet specified test requirements for the influence parameters; and then evaluating a plurality of test values originating from the plurality of valid test runs with respect to at least one of accuracy, repeatability and reproducibility.
公开/授权文献
- US20220206067A1 METHOD FOR TESTING A DEVICE UNDER TEST 公开/授权日:2022-06-30
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