- 专利标题: Method for manufacturing a multilayer structure with embedded functionalities and related multilayer structure
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申请号: US16113388申请日: 2018-08-27
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公开(公告)号: US11357111B2公开(公告)日: 2022-06-07
- 发明人: Janne Asikkala , Tomi Simula , Antti Keränen
- 申请人: TactoTek Oy
- 申请人地址: FI Oulunsalo
- 专利权人: TactoTek Oy
- 当前专利权人: TactoTek Oy
- 当前专利权人地址: FI Oulunsalo
- 代理机构: Carter, DeLuca & Farrell LLP
- 代理商 Robert P. Michal, Esq.
- 主分类号: H05K3/46
- IPC分类号: H05K3/46 ; H01L23/485 ; H01L23/498 ; H05K1/18 ; H05K3/00 ; H05K3/12 ; H05K3/10 ; H01R13/405 ; H05K1/02
摘要:
A method for manufacturing an integrated multilayer structure includes obtaining a substrate film having first and second sides, providing at least on the first side one or more first functional features, arranging at least one layer upon at least the first side; removing, at least a portion of the substrate film so that space is released in the structure wherein a detachment-enhancing feature provided to the substrate film is configured to facilitate the removal of the at least a portion of the substrate film such that the adjacent remaining film material, if any, the arranged layer and the one or more first functional features are preserved and preferably remain substantially intact; and providing at least one second functional feature into the space released for use so that the at least one second functional feature operatively connects with at least one of the one or more first functional features.
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