- 专利标题: Inspection apparatus and operating method thereof
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申请号: US16713886申请日: 2019-12-13
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公开(公告)号: US11366068B2公开(公告)日: 2022-06-21
- 发明人: Dae Sung Koo , Yong Kim , Ki Won Park , Yong Kim , Seo Jeong Jang
- 申请人: KOH YOUNG TECHNOLOGY INC.
- 申请人地址: KR Seoul
- 专利权人: KOH YOUNG TECHNOLOGY INC.
- 当前专利权人: KOH YOUNG TECHNOLOGY INC.
- 当前专利权人地址: KR Seoul
- 代理机构: Kile Park Reed & Houtteman PLLC
- 优先权: KR10-2016-0151400 20161114
- 主分类号: G01N21/88
- IPC分类号: G01N21/88
摘要:
According to the disclosure, an inspection apparatus determines whether a defect has occurred in a plurality of first inspection objects by comparing a reference range with the measurement value of the plurality of first inspection objects, identifies a plurality of second inspection objects in which a first error has occurred, and a plurality of third inspection objects in which a second error has occurred based on a result of determination whether the defect has occurred, adjusts the reference range based on measurement values of the plurality of second and third inspection objects, determines at least one of an occurrence probability of the first error and the second error based on the adjusted reference range, and displays at least one of a graph indicating the result of determination whether the defect has occurred, the adjusted reference range, the determined occurrence probability of the first error and the second error.
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