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公开(公告)号：US20240329519A1
公开(公告)日：2024-10-03
申请号：US18553390
申请日：2022-03-30
发明人： Hyung Jun LIM , Soon Geun KWON , Hak Jong CHOI , Jun Hyoung AHN , Gee Hong KIM , Kee Bong CHOI , Jae Jong LEE
CPC分类号： G03F7/0002 , B29C59/002 , B29C59/022 , B29C59/16
摘要： The imprinting device according to a representative embodiment includes: a stamp holder configured such that a stamp is mounted thereon; a substrate holder arranged in a first direction with respect to the stamp holder and configured such that a substrate is mounted thereon; an ultraviolet emitter configured to emit ultraviolet rays toward the substrate mounted on the substrate holder; and a pressing module configured to move at least one of the substrate holder or the stamp holder such that the substrate holder and the stamp mounted on the stamp holder come into contact with each other, wherein the imprinting device is configured to allow the stamp to be mounted on the stamp holder in a state in which the substrate holder and the stamp holder are spaced apart from each other by a predetermined distance or more.
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2.发明授权公开(公告)号：US11984217B2
公开(公告)日：2024-05-14
申请号：US16487636
申请日：2018-02-21
IPC分类号： G16H30/40 , G06N3/08 , G06N20/00 , G06T11/00 , G16H50/20 , G16H50/50 , G16H30/20 , G16H70/00
CPC分类号： G16H30/40 , G06N3/08 , G06N20/00 , G06T11/001 , G16H50/20 , G16H50/50 , G06T2210/41 , G16H30/20 , G16H70/00
摘要： A method for processing one or more histological images captured by a medical imaging device is disclosed. In this method, the histological image is received, and target regions each of which corresponds to a candidate type of tissue are identified based on a predictive model associating one more sample histological images with one or more sample target histological images. One or more display characteristics associated with the identified at least one target histological image is applied to the histological image.
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公开(公告)号：US11921151B2
公开(公告)日：2024-03-05
申请号：US17425497
申请日：2020-01-22
发明人： Myong Kang , Kang Jo Hwang , Choung Min Jung
IPC分类号： G01R31/28 , G01R1/04 , G01R1/067 , G01R1/073 , G01R31/304
CPC分类号： G01R31/2808
摘要： An inspection apparatus according to one embodiment of the present disclosure is configured to inspect an inspection object seated on a jig, the jig capable of being introduced into and withdrawn from the inspection apparatus. The inspection apparatus includes: a mover configured to move the jig; and a clamping driver configured to contact and press the jig, the clamping driver including a pressing portion configured to be movable in a clamping direction and an unclamping direction opposite to the clamping direction.
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公开(公告)号：US20230284933A1
公开(公告)日：2023-09-14
申请号：US18248856
申请日：2021-10-13
发明人： Moon Young JEON , Seung Yeol RYU
CPC分类号： A61B5/1079 , A61B5/0013 , A61B5/1077 , A61B5/0077 , A61B5/065 , A61B2090/364
摘要： A portable three-dimensional image measuring device according to various embodiments of the present disclosure may include a light source configured to output patterned light; a camera configured to generate a light field image of an object by receiving reflected light generated by reflecting the patterned light from the object; and an optical path control element configured to reflect the patterned light output from the light source so that the object is irradiated with the patterned light, and to transmit the reflected light reflected from the object so that the reflected light reaches the camera. An optical path of the patterned light output from the light source and irradiated onto the object and an optical path of the reflected light reflected from the object and reaching the camera may overlap coaxially in a section between the optical path control element and the object.
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公开(公告)号：US11694916B2
公开(公告)日：2023-07-04
申请号：US17280037
申请日：2019-10-11
发明人： Jung Woo Park , Byung Sun Oh
CPC分类号： H01L21/67242 , G01B11/2545 , G01B11/2513 , G01B11/2518
摘要： The present disclosure provides an apparatus. The apparatus according to the present disclosure comprises: at least one first light source configured to irradiate illumination light to an object on a reference surface; at least one second light source configured to irradiate pattern light to the object, a plurality of cameras configured to capture one or more illumination images and one or more pattern images; and one or more processors configured to determine a plurality of outlines indicating edges of the object based on two or more images captured in different directions among the one or more illumination images and the one or more pattern images; determine a virtual plane corresponding to an upper surface of the object based on the plurality of outlines; and determine an angle between the virtual plane and the reference plane.
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公开(公告)号：US20230073723A1
公开(公告)日：2023-03-09
申请号：US17789725
申请日：2021-05-31
发明人： Guk HAN , Jae Hwan LEE , Duk Young LEE , Chan Woo PARK
摘要： An electronic apparatus according to various embodiments of the present disclosure may include: a communication circuit that is communicatively connected to a solder printing apparatus and a measurement apparatus; one or more memories; and one or more processors. One or more processors may be configured to: acquire a first control parameter set of the solder printing apparatus for printing solder on a first substrate; transmit information indicating the first control parameter set to the solder printing apparatus; acquire first solder measurement information indicating a state of the solder printed on the first substrate; determine a first yield for the first substrate based on the first solder measurement information; and generate a model for searching for an optimal control parameter set based on a first data pair including the first control parameter set and the first yield.
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公开(公告)号：US20220357149A1
公开(公告)日：2022-11-10
申请号：US17623497
申请日：2020-06-29
发明人： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
摘要： The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes a first light source configured to irradiate first pattern lights to the object, first image sensors configured to capture first reflected lights generated by reflecting the first pattern lights from the object, a second light source configured to sequentially irradiate second pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the second pattern lights, a second image sensor configured to capture second reflected lights generated by reflecting the second pattern lights from the partial region, and a processor configured to determine the first three-dimensional shape of the object based on the first reflected lights and the second reflected lights.
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公开(公告)号：US11366068B2
公开(公告)日：2022-06-21
申请号：US16713886
申请日：2019-12-13
发明人： Dae Sung Koo , Yong Kim , Ki Won Park , Yong Kim , Seo Jeong Jang
IPC分类号： G01N21/88
摘要： According to the disclosure, an inspection apparatus determines whether a defect has occurred in a plurality of first inspection objects by comparing a reference range with the measurement value of the plurality of first inspection objects, identifies a plurality of second inspection objects in which a first error has occurred, and a plurality of third inspection objects in which a second error has occurred based on a result of determination whether the defect has occurred, adjusts the reference range based on measurement values of the plurality of second and third inspection objects, determines at least one of an occurrence probability of the first error and the second error based on the adjusted reference range, and displays at least one of a graph indicating the result of determination whether the defect has occurred, the adjusted reference range, the determined occurrence probability of the first error and the second error.
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9.发明申请公开(公告)号：US20220142028A1
公开(公告)日：2022-05-05
申请号：US17235551
申请日：2021-04-20
发明人： Duk Young LEE , Jae Hwan LEE , Jin Hyung TAK , Chan Woo PARK , Guk HAN
IPC分类号： H05K13/08 , G05B19/418
摘要： The present disclosure provides an apparatus for determining mounting information. The apparatus according to the present disclosure may be configured to acquire solder measurement information indicating a state of a solder printed on a first substrate, determine whether or not the state of the solder is changed from states of solders printed on second substrates, which are measured prior to measurement of the first substrate, based on the solder measurement information, upon the determination that the state of the solder is not changed, determine mounting information indicating a mounting condition for mounting a first component on the first substrate using one or more models, and deliver the mounting information to a mounter. The one or more models may be configured to output the mounting information based on a correlation between states of a second component before and after a reflow process for each of the second substrates.
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公开(公告)号：US11253336B2
公开(公告)日：2022-02-22
申请号：US16313290
申请日：2018-08-31
申请人： KOH YOUNG TECHNOLOGY INC. , INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
发明人： Byung Ju Yi , Jae Hong Woo
摘要： A medical arm assembly according to embodiments disclosed includes: a remote joint where a remote point spaced forward from a reference point is located; a positioning arm section configured to support the remote joint, move the remote joint that a relative position of the remote point with respect to the reference point is changed in forward-and-rearward direction and upward-and-downward direction, and fix the relative position of the remote point with respect to the reference point; an operating arm section connected to the remote joint and configured to fix a surgery tool, rotate the surgery tool about a remote-rotation axis through the remote point in left-and-right direction, and move the surgery tool in a direction perpendicular to the remote rotation axis and through the remote point; and an arm supporting section where the positioning arm section and the operating arm section are supported by connecting and the reference point is located.
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