Invention Grant
- Patent Title: Parametric top-view representation of scenes
-
Application No.: US16526073Application Date: 2019-07-30
-
Publication No.: US11373067B2Publication Date: 2022-06-28
- Inventor: Samuel Schulter , Ziyan Wang , Buyu Liu , Manmohan Chandraker
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Agent Joseph Kolodka
- Main IPC: G06K9/62
- IPC: G06K9/62 ; B60R11/04 ; G05D1/02 ; G06N3/02 ; G06V20/56 ; H04N5/32 ; B60W50/14 ; B60W60/00 ; G06N3/04 ; G06N3/08 ; G06V10/82 ; H04N5/232

Abstract:
A method for implementing parametric models for scene representation to improve autonomous task performance includes generating an initial map of a scene based on at least one image corresponding to a perspective view of the scene, the initial map including a non-parametric top-view representation of the scene, implementing a parametric model to obtain a scene element representation based on the initial map, the scene element representation providing a description of one or more scene elements of the scene and corresponding to an estimated semantic layout of the scene, identifying one or more predicted locations of the one or more scene elements by performing three-dimensional localization based on the at least one image, and obtaining an overlay for performing an autonomous task by placing the one or more scene elements with the one or more respective predicted locations onto the scene element representation.
Public/Granted literature
- US20200050900A1 PARAMETRIC TOP-VIEW REPRESENTATION OF SCENES Public/Granted day:2020-02-13
Information query