- 专利标题: Surface modified depth controlled deposition for plasma based deposition
-
申请号: US16938729申请日: 2020-07-24
-
公开(公告)号: US11373862B2公开(公告)日: 2022-06-28
- 发明人: Joseph Abel , Adrien Lavoie , Purushottam Kumar
- 申请人: Lam Research Corporation
- 申请人地址: US CA Fremont
- 专利权人: Lam Research Corporation
- 当前专利权人: Lam Research Corporation
- 当前专利权人地址: US CA Fremont
- 代理机构: Penilla IP, APC
- 主分类号: C23C16/02
- IPC分类号: C23C16/02 ; C23C16/34 ; C23C16/455 ; H01L21/02 ; H01J37/32
摘要:
Method for gap fill includes performing in order the following: (a) performing, consecutively, a first plurality of cycles of an atomic layer deposition process on a substrate; (b) purging process gases from the atomic layer deposition process; (c) performing a first plasma treatment on the substrate by introducing a fluorine plasma in the process chamber; (d) purging process gases from the plasma treatment; (e) repeating, in order, operations (a) through (d) until a predefined plurality of cycles has been performed; (f) performing, consecutively, a second plurality of cycles of the atomic layer deposition process on the substrate; (g) purging process gases from the atomic layer deposition process; (h) performing a second plasma treatment on the substrate by introducing a fluorine plasma in the process chamber; (i) purging process gases from the plasma treatment; (j) repeating, in order, operations (f) through (i) until a predefined plurality of cycles has been performed.
信息查询
IPC分类: