Invention Grant
- Patent Title: Failure mode specific analytics using parametric models
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Application No.: US17235686Application Date: 2021-04-20
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Publication No.: US11385950B2Publication Date: 2022-07-12
- Inventor: Rashmi B. Shetty
- Applicant: SAP SE
- Applicant Address: DE Walldorf
- Assignee: SAP SE
- Current Assignee: SAP SE
- Current Assignee Address: DE Walldorf
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06N20/00

Abstract:
Techniques for predicting failure mode specific reliability characteristics of tangible equipment using parametric probability models are disclosed. In some example embodiments, a computer system receives a model training configuration entered via a user interface, trains a failure curve model for a selected failure mode of a selected equipment model based on the model training configuration at a time indicated by training schedule data, generating, and generates analytical data for the selected failure mode of the selected equipment model using the trained failure curve model. The failure mode corresponds to a specific way in which the equipment model is capable of failing. In some example embodiments, the training of the failure curve model comprises determining a shape parameter and a scale parameter for the failure curve model based on a fitting of failure event data to a continuous probability distribution, and storing the parameters for use in generating the analytical data.
Public/Granted literature
- US20210240559A1 FAILURE MODE SPECIFIC ANALYTICS USING PARAMETRIC MODELS Public/Granted day:2021-08-05
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