Robust soft error tolerant multi-bit D flip-flop circuit
Abstract:
A circuit and methods of operation thereof are provided for robust protection against soft errors. The circuit includes a first set of storage elements coupled to and configured to sample a set of data inputs at a first set of times. The circuit includes a second set of storage elements coupled to and configured to sample the set of data inputs at a second set of times. A first parity generator generates a first parity check for the set of data inputs and a second parity generator generates a second parity check for output of the first set of storage elements. An error correction unit compares the first parity check and the second parity check to detect occurrences of error conditions in the circuit. The error correction unit may control output or operating characteristics of the circuit as a result of error conditions detected.
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