Invention Grant
- Patent Title: Memory device activity-based copying defect management data
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Application No.: US16931178Application Date: 2020-07-16
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Publication No.: US11429479B2Publication Date: 2022-08-30
- Inventor: Sai Krishna Mylavarapu
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/07 ; G06F12/02 ; G06F11/30

Abstract:
Various embodiments described herein provide for copying (e.g., to cache) a portion of defect management data for a block of a memory device, such as a non-volatile memory device of a memory sub-system, based on activity of the memory device. For instance, the portion of defect management data can be copied from a first-type memory device of the memory sub-system to a second-type memory device of the memory sub-system, where the first-type memory device stores defect management data for a working set of blocks of the non-volatile memory device being operated upon by the memory sub-system, where the second-type memory device is used to store defect management data for an active block of the working set of blocks, and where the second-type memory device has a faster access (e.g., read or write access) than the first-type memory device.
Public/Granted literature
- US20220019502A1 MEMORY DEVICE ACTIVITY-BASED COPYING DEFECT MANAGEMENT DATA Public/Granted day:2022-01-20
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