发明授权
- 专利标题: System and method for reducing cell area and current leakage in anti-fuse cell array
-
申请号: US16786499申请日: 2020-02-10
-
公开(公告)号: US11437386B2公开(公告)日: 2022-09-06
- 发明人: Meng-Sheng Chang , Chia-En Huang , Shao-Yu Chou , Yih Wang
- 申请人: Taiwan Semiconductor Manufacturing Company Limited
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company Limited
- 当前专利权人: Taiwan Semiconductor Manufacturing Company Limited
- 当前专利权人地址: TW Hsinchu
- 代理机构: Foley & Lardner LLP
- 主分类号: H01L27/112
- IPC分类号: H01L27/112 ; H01L23/528 ; H01L23/532 ; G11C17/16 ; G06F30/392 ; H01L23/525 ; G11C17/18
摘要:
A memory device includes a first memory cell having a first polysilicon line associated with a first read word line and intersecting a first active region and a second active region, and a second polysilicon line and a first CPODE associated with a first program word line, the second polysilicon line intersecting the first active region and the first CPODE intersecting the second active region. The memory device also includes a second memory cell adjacent to the first memory cell, the second memory cell having a third polysilicon line associated with a second read word line and intersecting the first active region and the second active region, and a fourth polysilicon line and a second CPODE associated with a second program word line, the fourth polysilicon line intersecting the second active region and the second CPODE intersecting the first active region to form a cross-arrangement of CPODE.
公开/授权文献
信息查询
IPC分类: