- 专利标题: Ligand selection for ternary oxide thin films
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申请号: US16514351申请日: 2019-07-17
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公开(公告)号: US11462398B2公开(公告)日: 2022-10-04
- 发明人: Martin Michael Frank , John Rozen , Yohei Ogawa
- 申请人: International Business Machines Corporation , ULVAC, Inc.
- 申请人地址: US NY Armonk; JP Kanagawa
- 专利权人: International Business Machines Corporation,ULVAC, Inc.
- 当前专利权人: International Business Machines Corporation,ULVAC, Inc.
- 当前专利权人地址: US NY Armonk; JP Kanagawa
- 代理机构: Cantor Colburn LLP
- 代理商 Robert Sullivan
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; H01L29/788 ; H01L29/78 ; H01L45/00
摘要:
Embodiments of the present invention are directed to forming a ternary compound using a modified atomic layer deposition (ALD) process. In a non-limiting embodiment of the invention, a first precursor and a second precursor are selected. The first precursor includes a first metal and a first ligand. The second precursor includes a second metal and a second ligand. The second ligand is selected based on the first ligand to target a second metal uptake. A substrate is exposed to the first precursor during a first pulse of an ALD cycle and the substrate is exposed to the second precursor during a second pulse of the ALD cycle, the second pulse occurring after the first pulse. The substrate is exposed to a third precursor (e.g., an oxidant) during a third pulse of the ALD cycle. The ternary compound can include a ternary oxide film.
公开/授权文献
- US20210020426A1 LIGAND SELECTION FOR TERNARY OXIDE THIN FILMS 公开/授权日:2021-01-21
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