- 专利标题: Method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation
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申请号: US16870940申请日: 2020-05-09
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公开(公告)号: US11486925B2公开(公告)日: 2022-11-01
- 发明人: Yigang He , Wei He , Baiqiang Yin , Bing Li , Zhigang Li , Lei Zuo , Chaolong Zhang
- 申请人: HEFEI UNIVERSITY OF TECHNOLOGY
- 申请人地址: CN Anhui
- 专利权人: HEFEI UNIVERSITY OF TECHNOLOGY
- 当前专利权人: HEFEI UNIVERSITY OF TECHNOLOGY
- 当前专利权人地址: CN Anhui
- 主分类号: G01R31/3163
- IPC分类号: G01R31/3163 ; G06N5/04 ; G06N20/00 ; G06N3/00
摘要:
A method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation, includes steps of: step (1) acquiring a fault response voltage signal of an analog circuit; step (2) carrying out wavelet packet transform on the collected signal, and calculating a wavelet packet coefficient energy value as a characteristic parameter; step (3) utilizing a quantum particle swarm optimization algorithm to optimize a regularization parameter and kernel parameter of vector-valued regularized kernel function approximation, and training a fault diagnosis model; and step (4) utilizing the trained diagnosis model to recognize circuit faults.
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