Invention Grant
- Patent Title: Substrate processing apparatus and method
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Application No.: US17193545Application Date: 2021-03-05
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Publication No.: US11532784B2Publication Date: 2022-12-20
- Inventor: Manabu Nakagawasai , Koji Maeda , Shinji Orimoto , Motoi Yamagata
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Fenwick & West LLP
- Priority: JPJP2020-039064 20200306
- Main IPC: H01L43/12
- IPC: H01L43/12 ; C23C14/50 ; C23C14/54

Abstract:
A substrate processing apparatus includes a processing chamber where a substrate support on which a substrate is placed and a target holder configured to hold a target are disposed, a freezing device disposed with a gap with respect to a bottom surface of the substrate support and having a chiller and a cold heat medium laminated on the chiller, and a rotating device configured to rotate the substrate support. The substrate processing apparatus further includes a first elevating device configured to raise and lower the substrate support, a coolant channel formed in the chiller to supply a coolant to the gap, and a cold heat transfer material disposed in the gap and being in contact with the substrate support and the cold heat medium so as to transfer heat therebetween.
Public/Granted literature
- US20210280777A1 SUBSTRATE PROCESSING APPARATUS AND METHOD Public/Granted day:2021-09-09
Information query
IPC分类: