Invention Grant
- Patent Title: Systems and methods for depositing high density and high tensile stress films
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Application No.: US17009002Application Date: 2020-09-01
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Publication No.: US11538677B2Publication Date: 2022-12-27
- Inventor: Chuanxi Yang , Hang Yu , Yu Yang , Chuan Ying Wang , Allison Yau , Xinhai Han , Sanjay G. Kamath , Deenesh Padhi
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C23C16/34

Abstract:
Exemplary methods of semiconductor processing may include flowing a silicon-containing precursor, a nitrogen-containing precursor, and diatomic hydrogen into a processing region of a semiconductor processing chamber. A substrate may be housed within the processing region of the semiconductor processing chamber. The methods may also include forming a plasma of the silicon-containing precursor, the nitrogen-containing precursor, and the diatomic hydrogen. The plasma may be formed at a frequency above 15 MHz. The methods may also include depositing a silicon nitride material on the substrate.
Public/Granted literature
- US20220068630A1 SYSTEMS AND METHODS FOR DEPOSITING HIGH DENSITY AND HIGH TENSILE STRESS FILMS Public/Granted day:2022-03-03
Information query
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