- 专利标题: Apparatus with latch correction mechanism and methods for operating the same
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申请号: US17100775申请日: 2020-11-20
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公开(公告)号: US11550654B2公开(公告)日: 2023-01-10
- 发明人: Yuan He , Jiyun Li
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Perkins Coie LLP
- 主分类号: G06F11/10
- IPC分类号: G06F11/10 ; G06K9/62 ; G06F1/12 ; G06F1/10
摘要:
Methods, apparatuses, and systems related to an apparatus are described. The apparatus may include (1) a fuse array configured to provide non-volatile storage of fuse data and (2) local latches configured to store the fuse data during runtime of the apparatus. The apparatus may further include an error processing circuit configured to determine error detection-correction data for the fuse data. The apparatus may subsequently broadcast data stored in the local latches to the error processing circuit to determine, using the error detection-correction data, whether the locally latched data has been corrupted. The error processing circuit may generate corrected data to replace the locally latched data based on determining corruption in the locally latched data.