Invention Grant
- Patent Title: Semiconductor package for improving reliability
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Application No.: US17223601Application Date: 2021-04-06
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Publication No.: US11557560B2Publication Date: 2023-01-17
- Inventor: Yeohoon Yoon , Hyungsun Jang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2020-0106427 20200824
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L23/498

Abstract:
A semiconductor package includes a chip level unit including a semiconductor chip; a medium level unit; and a solder ball unit. The solder ball unit is to be connected to a circuit substrate. The medium level unit includes: a wiring pad layer on a first protection layer; a second protection layer including a pad-exposing hole on the first protection layer, a post layer in the pad-exposing hole on the wiring pad layer; and a third protection layer including a post-exposing hole on the second protection layer. A width or diameter of the post-exposing hole is smaller than a width or diameter of the pad-exposing hole; and a barrier layer is disposed in the post-exposing hole on the post layer. The solder ball unit includes a solder ball on the barrier layer.
Public/Granted literature
- US20220059492A1 SEMICONDUCTOR PACKAGE FOR IMPROVING RELIABILITY Public/Granted day:2022-02-24
Information query
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