Invention Grant
- Patent Title: Dimension measurement method using projection image obtained by X-ray CT apparatus
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Application No.: US16455883Application Date: 2019-06-28
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Publication No.: US11561091B2Publication Date: 2023-01-24
- Inventor: Yutaka Ohtake , Tasuku Ito , Tomonori Goto , Masato Kon
- Applicant: THE UNIVERSITY OF TOKYO , MITUTOYO CORPORATION
- Applicant Address: JP Tokyo; JP Kanagawa
- Assignee: THE UNIVERSITY OF TOKYO,MITUTOYO CORPORATION
- Current Assignee: THE UNIVERSITY OF TOKYO,MITUTOYO CORPORATION
- Current Assignee Address: JP Tokyo; JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2018-127917 20180704
- Main IPC: G01B15/02
- IPC: G01B15/02 ; G01N23/046 ; G01B15/04 ; G01B15/00

Abstract:
In measuring a dimension of an object to be measured W made of a single material, a plurality of transmission images of the object to be measured W are obtained by using an X-ray CT apparatus, and then respective projection images are generated. The projection images are registered with CAD data used in designing the object to be measured W. The dimension of the object to be measured W is calculated by using a relationship between the registered CAD data and projection images. In such a manner, high-precision dimension measurement is achieved by using several tens of projection images and design information without performing CT reconstruction.
Public/Granted literature
- US20200011662A1 DIMENSION MEASUREMENT METHOD USING PROJECTION IMAGE OBTAINED BY X-RAY CT APPARATUS Public/Granted day:2020-01-09
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