发明授权
- 专利标题: Techniques for measuring collision rate with spatial filtering of scattered light
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申请号: US17072916申请日: 2020-10-16
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公开(公告)号: US11561148B2公开(公告)日: 2023-01-24
- 发明人: Neal Pisenti , Kenneth Wright , Jason Madjdi Amini , Jwo-Sy Chen
- 申请人: IonQ, Inc.
- 申请人地址: US MD College Park
- 专利权人: IonQ, Inc.
- 当前专利权人: IonQ, Inc.
- 当前专利权人地址: US MD College Park
- 代理机构: ArentFox Schiff LLP
- 主分类号: G01L21/30
- IPC分类号: G01L21/30 ; G06N10/00
摘要:
Aspects of the present disclosure describe techniques for measuring collision rate with spatial filtering of scattered light. For example, a method for characterizing vacuum in a chamber is described that includes generating, inside the chamber, a potential well having a single, shallow potential region within which an ion is trapped, the shallow potential region having a lowest potential of the potential well, optically monitoring the ion within the potential well, detecting, based on the optically monitoring, a movement of the ion away from the shallow potential region in response to a collision with a background gas, and determining a pressure inside the chamber based on a rate of detected movements of the ion.
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