- 专利标题: Scanning-type x-ray source and imaging system therefor
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申请号: US17137064申请日: 2020-12-29
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公开(公告)号: US11569055B2公开(公告)日: 2023-01-31
- 发明人: Zhili Cui , Jian Gao , Jinhui Xing
- 申请人: Zhili Cui , Jian Gao , Jinhui Xing
- 申请人地址: CN Beijing; CN Beijing; CN Beijing
- 专利权人: Zhili Cui,Jian Gao,Jinhui Xing
- 当前专利权人: Zhili Cui,Jian Gao,Jinhui Xing
- 当前专利权人地址: CN Beijing; CN Beijing; CN Beijing
- 代理机构: Upstream Research and Patent LLC
- 代理商 George Guosheng Wang
- 优先权: CN201810694166.6 20180629,CN201821016550.2 20180629
- 主分类号: H01J35/30
- IPC分类号: H01J35/30 ; H01J35/04 ; H01J35/18 ; H01J35/08 ; H01J35/14 ; H01J35/12 ; H01J35/06 ; G01N23/046
摘要:
Provided are a scanning-type X-ray source and an imaging system therefor. The scanning-type X-ray source comprises a vacuum cavity (1), wherein a cathode (2) and a plurality of anode target structures (3) are arranged in the vacuum cavity (1); a gate electrode (4) is arranged in a position, close to the cathode (2), in the vacuum cavity (1); a focusing electrode (5) is arranged in a position, close to the gate electrode (4), in the vacuum cavity (1); and a deflection coil (6) is arranged in a position, close to the gate electrode (4), at the outer periphery of the vacuum cavity (1). The scanning-type X-ray source generates electron beams by using cathode (2), controls the powering-on/off of the electron beams by the gate electrode (4), and the deflection coil (6) controls the direction of motion of the electron beams, so as to complete the switching between multiple focuses.
公开/授权文献
- US20210148840A1 SCANNING-TYPE X-RAY SOURCE AND IMAGING SYSTEM THEREFOR 公开/授权日:2021-05-20
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