Invention Grant
- Patent Title: High-frequency magnetoimpedance testing apparatus and method
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Application No.: US17141779Application Date: 2021-01-05
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Publication No.: US11585786B2Publication Date: 2023-02-21
- Inventor: Ze Li , Jingshun Liu , Guanyu Cao , Rui Liu , Shuqin Xiao
- Applicant: Inner Mongolia University of Technology , Shandong University
- Applicant Address: CN Hohhot; CN Shandong
- Assignee: Inner Mongolia University of Technology,Shandong University
- Current Assignee: Inner Mongolia University of Technology,Shandong University
- Current Assignee Address: CN Hohhot; CN Shandong
- Agency: Meunier Carlin & Curfman LLC
- Priority: CN202011208839.6 20201103
- Main IPC: G01N27/72
- IPC: G01N27/72 ; G01N33/20 ; H01R13/646 ; G06F13/42

Abstract:
The present disclosure provides a high-frequency magnetoimpedance testing apparatus and method. A testing platform in the apparatus is arranged within a Helmholtz coil and connected to a modulating electric current source and a high-frequency impedance analyzer, respectively; the Helmholtz coil is connected to a DC power source; a processor is connected to the high-frequency impedance analyzer and the DC power source separately; the testing platform includes a first double-sided copper-clad plate, and mode transition switches and connection terminals that are arranged on the first double-sided copper-clad plate; one end of the first double-sided copper-clad plate is connected to the high-frequency impedance analyzer, while the other end of the same is connected to a load; the mode transition switches are connected to the modulating electric current source. The present disclosure can realize in-situ current modulation of metallic fibers and high-frequency magnetoimpedance testing, and improve the testing accuracy.
Public/Granted literature
- US20220137000A1 High-Frequency Magnetoimpedance Testing Apparatus and Method Public/Granted day:2022-05-05
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