Systems, apparatus and methods are provided for loopback testing techniques for memory controllers. A memory controller that may comprise loopback testing circuitry that may comprise a first multiplexer having a first input coupled to an output of an input buffer and a second input coupled to a first data output from the memory controller, an inverter coupled to the output of the input buffer, and a second multiplexer having a first input coupled to an output of the inverter and a second input coupled to a second data output from the memory controller.