- 专利标题: Recovering from hard decoding errors by remapping log likelihood ratio values read from NAND memory cells
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申请号: US17733724申请日: 2022-04-29
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公开(公告)号: US11595058B1公开(公告)日: 2023-02-28
- 发明人: Naveen Kumar , Shuhei Tanakamaru , Erich Franz Haratsch
- 申请人: Seagate Technology LLC
- 申请人地址: US CA Fremont
- 专利权人: Seagate Technology LLC
- 当前专利权人: Seagate Technology LLC
- 当前专利权人地址: US CA Fremont
- 代理机构: Mueting Raasch Group
- 主分类号: H03M13/01
- IPC分类号: H03M13/01 ; H03M13/11 ; H03M13/39
摘要:
Hard errors are determined for an unsuccessful decoding of codeword bits read from NAND memory cells via a read channel and input to a low-density parity check (LDPC) decoder. A bit error rate (BER) for the hard errors is estimated and BER for the read channel is estimated. Hard error regions are found using a single level cell (SLC) reading of the NAND memory cells. A log likelihood ratio (LLR) mapping of the codeword bits input to the LDPC decoder is changed based on the hard error regions, the hard error BER, and/or the read channel BER.
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