Invention Grant
- Patent Title: Output terminal fault detection circuit
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Application No.: US17168528Application Date: 2021-02-05
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Publication No.: US11598802B2Publication Date: 2023-03-07
- Inventor: Kemal Safak Demirci , Shanmuganand Chellamuthu , Qunying Li
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Valerie M. Davis; Frank D. Cimino
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H03K5/24 ; H03K19/20 ; H03F3/45
Abstract:
A circuit includes a gain stage, first and second amplifiers, and a comparison circuit. The gain stage has an input and an output. The first amplifier has an input and an output. The input of the first amplifier is coupled to the input of the gain stage. The second amplifier has an input and an output. The input of the second amplifier is coupled to the output of the gain stage. The comparison circuit is coupled to the outputs of the first and second amplifiers. The comparison circuit is configured to compare signals on the outputs of the first and second amplifiers and to generate a fault flag signal responsive to the output signal from the first amplifier being different than the output signal from the second amplifier.
Public/Granted literature
- US20220252663A1 OUTPUT TERMINAL FAULT DETECTION CIRCUIT Public/Granted day:2022-08-11
Information query
