Invention Grant
- Patent Title: Surveying instrument and surveying instrument system
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Application No.: US17202692Application Date: 2021-03-16
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Publication No.: US11598874B2Publication Date: 2023-03-07
- Inventor: Fumio Ohtomo , Kaoru Kumagai , Tetsuji Anai
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JPJP2020-047264 20200318
- Main IPC: G01S17/89
- IPC: G01S17/89 ; G01S7/48 ; G01S17/42 ; H04N5/247

Abstract:
There is provided a surveying instrument including a distance measuring light projecting module, a light receiving module, an optical axis deflector provided in a common portion of a distance measuring optical axis and a light receiving optical axis, a projecting direction detector which detects an optical axis deflection angle and a deflecting direction, a narrow angle image pickup module for a narrow angle of view, a distance measurement arithmetic module, and an arithmetic control module, wherein the arithmetic control module controls the optical axis deflector and the distance measurement arithmetic module, the distance measurement arithmetic module performs a distance measurement of a measuring point based on a transmission signal of a measuring light and a reception signal of a measuring light, the narrow angle image pickup module acquires a narrow angle image with reference to the distance measuring optical axis, a sighting is performed every different objects, and an acquisition of the narrow angle image and a three-dimensional measurement are performed.
Public/Granted literature
- US20210293962A1 Surveying Instrument And Surveying Instrument System Public/Granted day:2021-09-23
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