Invention Grant
- Patent Title: Voltage threshold prediction-based memory management
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Application No.: US17234095Application Date: 2021-04-19
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Publication No.: US11599300B2Publication Date: 2023-03-07
- Inventor: Chun Sum Yeung , Guang Hu , Ting Luo , Tao Liu
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A method includes performing a first read operation involving a set of memory cells using a first voltage, determining a quantity of bits associated with the set of memory cells based on the first read operation, performing a second read operation involving the set of memory cells using a second voltage that is greater than the first voltage when the quantity of bits is above a threshold quantity of bits for the set of memory cells, and performing the second read operation involving the set of memory cells using a third voltage that is less than the first voltage when the quantity of bits is below the threshold quantity of bits for the set of memory cells.
Public/Granted literature
- US20220334753A1 VOLTAGE THRESHOLD PREDICTION-BASED MEMORY MANAGEMENT Public/Granted day:2022-10-20
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