- 专利标题: System and method for data quality monitors
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申请号: US17222308申请日: 2021-04-05
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公开(公告)号: US11599513B2公开(公告)日: 2023-03-07
- 发明人: Malina Kirn
- 申请人: Palantir Technologies Inc.
- 申请人地址: US CO Denver
- 专利权人: Palantir Technologies Inc.
- 当前专利权人: Palantir Technologies Inc.
- 当前专利权人地址: US CO Denver
- 代理机构: Knobbe, Martens, Olson & Bear LLP
- 主分类号: G06F16/00
- IPC分类号: G06F16/00 ; G06F16/215 ; G06F16/23 ; G06F16/2455 ; G06F11/07 ; A61B17/00 ; A61B17/04 ; G06F3/0482 ; G06F3/04847
摘要:
Systems and methods are presented for data quality monitoring. Data quality monitors may be created and configured to identify objects with specified data quality issues and/or property values. Objects identified by a data quality monitor can be presented to users for confirmation and resolution. Properties used by the data quality monitor to match objects may also be displayed to users.
公开/授权文献
- US20210326313A1 SYSTEM AND METHOD FOR DATA QUALITY MONITORS 公开/授权日:2021-10-21
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