Invention Grant
- Patent Title: Transceiver performing internal loopback test and operation method thereof
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Application No.: US17384991Application Date: 2021-07-26
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Publication No.: US11606113B2Publication Date: 2023-03-14
- Inventor: Younwoong Chung , Yungeun Nam , Jongshin Shin
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Lee IP Law, P.C.
- Priority: KR10-2020-0173398 20201211
- Main IPC: H04B1/40
- IPC: H04B1/40 ; H04B17/19 ; H03K19/00

Abstract:
Disclosed is a transceiver which includes a logic circuit that generates parallel transmission data in response to a first test mode signal or a second test mode signal, a serializer that converts the parallel transmission data into serial transmission data, a driver that outputs the serial transmission data through transmission pads, an analog circuit that receives serial reception data through reception pads, a deserializer that converts the serial reception data into parallel reception data, a plurality of test switches switched in response to the first test mode signal, and a test circuit that is electrically connected to the analog circuit through the plurality of test switches and outputs serial post data corresponding to the serial transmission data to the analog circuit.
Public/Granted literature
- US20220190869A1 TRANSCEIVER PERFORMING INTERNAL LOOPBACK TEST AND OPERATION METHOD THEREOF Public/Granted day:2022-06-16
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