Invention Grant
- Patent Title: Analyzer
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Application No.: US16934340Application Date: 2020-07-21
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Publication No.: US11609191B2Publication Date: 2023-03-21
- Inventor: Kazunori Tsukamoto , Shigeru Honda
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JPJP2019-135951 20190724
- Main IPC: G01N23/2209
- IPC: G01N23/2209 ; G01N23/2208 ; G01N23/2252

Abstract:
An analyzer includes a wavelength-dispersive X-ray spectrometer and a control unit that controls the wavelength-dispersive X-ray spectrometer, the control unit performing: processing of acquiring an analysis result of preparatory analysis performed on a specimen to be analyzed; processing of setting spectroscopic conditions for WDS analysis using the wavelength-dispersive X-ray spectrometer based on the analysis result of the preparatory analysis; and processing of performing the WDS analysis on the specimen to be analyzed under the set spectroscopic conditions.
Public/Granted literature
- US20210025838A1 Analyzer Public/Granted day:2021-01-28
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