Invention Grant
- Patent Title: Target device and measuring system
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Application No.: US16676405Application Date: 2019-11-06
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Publication No.: US11630186B2Publication Date: 2023-04-18
- Inventor: Nobuyuki Nishita
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chiesa, Shahinian & Giantomasi PC
- Priority: JPJP2018-209604 20181107
- Main IPC: G01S7/481
- IPC: G01S7/481 ; G01S17/08 ; G01C15/00 ; G01C15/02 ; G01C15/04 ; G02B5/12

Abstract:
A target device, which allows a sufficient amount of reflected light to be obtained from an end portion, is provided and includes a measurement section. In the target device, a retroreflective layer in which a plurality of retroreflective elements are arranged on the entire circumference in a circumferential direction about an axis is formed on at least part of the outer peripheral surface of the measurement section. The retroreflective layer is formed into an uneven shape in which a distance from the axis changes along the entire circumference in the circumferential direction.
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