- 专利标题: Systems and methods for skewed basis set fitting
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申请号: US17221759申请日: 2021-04-02
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公开(公告)号: US11639892B2公开(公告)日: 2023-05-02
- 发明人: J. Brian Leen , Kyle Owen , John Savee , Dmitry Skvortsov , Paul Hansen , Raphael Desbiens
- 申请人: ABB Schweiz AG
- 申请人地址: CH Baden
- 专利权人: ABB Schweiz AG
- 当前专利权人: ABB Schweiz AG
- 当前专利权人地址: CH Baden
- 代理机构: Armstrong Teasdale LLP
- 主分类号: G01N21/31
- IPC分类号: G01N21/31
摘要:
Systems and methods for skewed basis set fitting may include obtaining measured absorption data indicative of an amount of absorption of light by a sample gas at each of multiple frequencies, determining an absorption dependent cavity time constant indicative of a skew to the measured absorption data caused by light reflections within a cavity in which the sample gas is contained, obtaining reference absorption data including basis sets indicative of reference amounts of light absorbed by each of multiple gases at each of the multiple frequencies, skewing the reference absorption data based on the absorption dependent cavity time constant to generate skewed reference absorption data, and fitting the measured absorption data to the skewed reference absorption data to identify an amount of at least one constituent gas within the sample gas.
公开/授权文献
- US20220317029A1 SYSTEMS AND METHODS FOR SKEWED BASIS SET FITTING 公开/授权日:2022-10-06
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