Invention Grant
- Patent Title: Systems and methods for skewed basis set fitting
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Application No.: US17221759Application Date: 2021-04-02
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Publication No.: US11639892B2Publication Date: 2023-05-02
- Inventor: J. Brian Leen , Kyle Owen , John Savee , Dmitry Skvortsov , Paul Hansen , Raphael Desbiens
- Applicant: ABB Schweiz AG
- Applicant Address: CH Baden
- Assignee: ABB Schweiz AG
- Current Assignee: ABB Schweiz AG
- Current Assignee Address: CH Baden
- Agency: Armstrong Teasdale LLP
- Main IPC: G01N21/31
- IPC: G01N21/31

Abstract:
Systems and methods for skewed basis set fitting may include obtaining measured absorption data indicative of an amount of absorption of light by a sample gas at each of multiple frequencies, determining an absorption dependent cavity time constant indicative of a skew to the measured absorption data caused by light reflections within a cavity in which the sample gas is contained, obtaining reference absorption data including basis sets indicative of reference amounts of light absorbed by each of multiple gases at each of the multiple frequencies, skewing the reference absorption data based on the absorption dependent cavity time constant to generate skewed reference absorption data, and fitting the measured absorption data to the skewed reference absorption data to identify an amount of at least one constituent gas within the sample gas.
Public/Granted literature
- US20220317029A1 SYSTEMS AND METHODS FOR SKEWED BASIS SET FITTING Public/Granted day:2022-10-06
Information query
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