发明授权
- 专利标题: Systems and methods for automatic visual inspection of defects in ophthalmic lenses
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申请号: US17028429申请日: 2020-09-22
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公开(公告)号: US11650126B2公开(公告)日: 2023-05-16
- 发明人: Juan Antonio Quiroga Mellado , José Alonso Fernández , Eduardo Pascual , Sergio Sampedro , Daniel Crespo Vázquez
- 申请人: Indizen Optical Technologies S.L.
- 申请人地址: ES Madrid
- 专利权人: Indizen Optical Technologies S.L.
- 当前专利权人: Indizen Optical Technologies S.L.
- 当前专利权人地址: ES Madrid
- 代理机构: SoCal IP Law Group LLP
- 代理商 Angelo Gaz; Mark A. Goldstein
- 主分类号: G01M11/02
- IPC分类号: G01M11/02 ; G01N21/958
摘要:
Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations.
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