Invention Grant
- Patent Title: Measurement apparatus and method
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Application No.: US17163652Application Date: 2021-02-01
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Publication No.: US11662292B2Publication Date: 2023-05-30
- Inventor: Tatsushi Ohyama , Mariko Miyashita
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP 2018165975 2018.09.05 JP 2019139109 2019.07.29
- Main IPC: G01N15/06
- IPC: G01N15/06

Abstract:
A measurement apparatus includes a light source, an interferometer, a light receiver, and a signal processor. The light source emits laser light to a scatterer in the atmosphere. The laser light has multiple oscillation frequencies separated from each other at equal frequency intervals. The interferometer produces interference in scattered light generated as a result of the laser light being scattered by the scatterer. The light receiver receives Mie scattered light included in the scattered light subjected to the interference produced by the interferometer and generates a signal. The signal processor detects the quantity of the Mie scattered light based on the signal. Each of the equal frequency intervals is smaller than the full width at half maximum of the peak of a frequency spectrum of Rayleigh scattered light. The Rayleigh scattered light is generated as a result of the laser light being scattered by molecules forming the atmosphere.
Public/Granted literature
- US20210181081A1 MEASUREMENT APPARATUS AND METHOD Public/Granted day:2021-06-17
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