Invention Grant
- Patent Title: Memory device including voltage control for diffusion regions associated with memory blocks
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Application No.: US17217014Application Date: 2021-03-30
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Publication No.: US11664076B2Publication Date: 2023-05-30
- Inventor: Go Shikata , Shigekazu Yamada
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C11/56
- IPC: G11C11/56 ; G11C16/16 ; G11C16/30

Abstract:
Some embodiments include apparatuses and methods of operating the apparatuses. One of the apparatuses includes a first memory block including first word lines for respective first memory cells of the first memory block; a second memory block including second word lines for respective second memory cells of the second memory block; first diffusion regions coupled to the first word lines; second diffusion regions adjacent the first diffusion regions, the second diffusion regions coupled to the second word lines; and a circuit to apply a voltage to the second diffusion regions in a write operation performed on the first memory block.
Public/Granted literature
- US20220208274A1 MEMORY DEVICE INCLUDING VOLTAGE CONTROL FOR DIFUSSION REGIONS ASSOCIATED WITH MEMORY BLOCKS Public/Granted day:2022-06-30
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