Invention Grant
- Patent Title: Checking status of multiple memory dies in a memory sub-system
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Application No.: US16946871Application Date: 2020-07-09
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Publication No.: US11681467B2Publication Date: 2023-06-20
- Inventor: Luca Nubile , Luca De Santis
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A processing device in a memory sub-system assigns each of a plurality of memory units associated with one or more memory die of a memory device a unique address by which each of the plurality of memory units is identified. The processing device further sends a multi-unit status command to the memory device, the multi-unit status command specifying a subset of the plurality of memory units using corresponding unique addresses and receives a response to the multi-unit status command, the response comprising a multi-bit value comprising a plurality of bits, wherein each bit of the plurality of bits represents a status of one or more parameters of a plurality of parameters for a corresponding one of the plurality of memory units.
Public/Granted literature
- US20220011970A1 CHECKING STATUS OF MULTIPLE MEMORY DIES IN A MEMORY SUB-SYSTEM Public/Granted day:2022-01-13
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