Methods and systems are provided for performing material capture to determine properties of an imaged surface. A plurality of images can be received depicting a material surface. The plurality of images can be calibrated to align corresponding pixels of the images and determine reflectance information for at least a portion of the aligned pixels. After calibration, a set of reference materials from a material library can be selected using the calibrated images. The set of reference materials can be used to determine a material model that accurately represents properties of the material surface.