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公开(公告)号:US10818022B2
公开(公告)日:2020-10-27
申请号:US16229759
申请日:2018-12-21
Applicant: ADOBE INC.
Inventor: Kalyan Krishna Sunkavalli , Sunil Hadap , Joon-Young Lee , Zhuo Hui
Abstract: Methods and systems are provided for performing material capture to determine properties of an imaged surface. A plurality of images can be received depicting a material surface. The plurality of images can be calibrated to align corresponding pixels of the images and determine reflectance information for at least a portion of the aligned pixels. After calibration, a set of reference materials from a material library can be selected using the calibrated images. The set of reference materials can be used to determine a material model that accurately represents properties of the material surface.
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公开(公告)号:US11682126B2
公开(公告)日:2023-06-20
申请号:US17080812
申请日:2020-10-26
Applicant: ADOBE INC.
Inventor: Kalyan Krishna Sunkavalli , Sunil Hadap , Joon-Young Lee , Zhuo Hui
CPC classification number: G06T7/49 , G01N21/55 , G06T3/0068 , G06T7/40 , G06T7/60 , G06T7/90 , G06T17/00 , G06T2200/08 , G06T2207/10016 , G06T2207/10152
Abstract: Methods and systems are provided for performing material capture to determine properties of an imaged surface. A plurality of images can be received depicting a material surface. The plurality of images can be calibrated to align corresponding pixels of the images and determine reflectance information for at least a portion of the aligned pixels. After calibration, a set of reference materials from a material library can be selected using the calibrated images. The set of reference materials can be used to determine a material model that accurately represents properties of the material surface.
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