Invention Grant
- Patent Title: Short program verify recovery with reduced programming disturbance in a memory sub-system
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Application No.: US17689862Application Date: 2022-03-08
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Publication No.: US11688471B2Publication Date: 2023-06-27
- Inventor: Hong-Yan Chen , Yingda Dong
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C16/34 ; G11C16/08 ; G11C16/26 ; G11C16/10

Abstract:
Control logic in a memory device initiates a program operation on the memory device, the program operation comprising a program phase, a program recovery phase, a program verify phase, and a program verify recovery phase. The control logic further causes a negative voltage signal to be applied to a first plurality of word lines of a data bock of the memory device during the program verify recovery phase of the program operation, wherein each of the first plurality of word lines is coupled to a corresponding memory cell of a first plurality of memory cells in a string of memory cells in the data block, the first plurality of word lines comprising a selected word line associated with the program operation and one or more data word lines adjacent to the selected word line.
Public/Granted literature
- US20220189565A1 SHORT PROGRAM VERIFY RECOVERY WITH REDUCED PROGRAMMING DISTURBANCE IN A MEMORY SUB-SYSTEM Public/Granted day:2022-06-16
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