Invention Grant
- Patent Title: Memory device including a landing pad with increased thickness of a conductive film in the landing area
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Application No.: US17249837Application Date: 2021-03-16
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Publication No.: US11688688B2Publication Date: 2023-06-27
- Inventor: Erh-Kun Lai
- Applicant: MACRONIX INTERNATIONAL CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L23/528
- IPC: H01L23/528 ; H01L21/768 ; H01L23/535 ; H01L23/522

Abstract:
A semiconductor structure is provided. The semiconductor structure includes a staircase structure including a first stair layer and a second stair layer on the first stair layer. The first stair layer comprises a first conductive film. The semiconductor structure includes a landing pad disposed on the first conductive film. The landing pad has a first pad sidewall facing toward the second stair layer, a first lateral gap distance between an upper portion of the first pad sidewall and the second stair layer is smaller than a second lateral gap distance between a lower portion of the first pad sidewall and the second stair layer.
Public/Granted literature
- US20220302029A1 SEMICONDUCTOR STRUCTURE Public/Granted day:2022-09-22
Information query
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