Invention Grant
- Patent Title: Display device and an inspection method of a display device
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Application No.: US16951060Application Date: 2020-11-18
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Publication No.: US11690168B2Publication Date: 2023-06-27
- Inventor: Yong Jin Shin , Kyun Ho Kim , Uk Jae Jang , Bong Im Park
- Applicant: SAMSUNG DISPLAY CO., LTD.
- Applicant Address: KR Yongin-si
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin-si
- Agency: F. Chau & Associates, LLC
- Priority: KR 20190149956 2019.11.20
- Main IPC: H05K1/02
- IPC: H05K1/02 ; H05K1/18 ; H01L23/498 ; H05K1/14 ; G09G3/00

Abstract:
A display device including: a display panel; a first substrate attached to a side of the display panel; and a second substrate attached to a side of the first substrate, wherein the display panel includes a first panel test pad and a second panel test pad, the first substrate includes a 1-1 circuit test lead overlapping and connected to the first panel test pad, a 1-2 circuit test lead overlapping and connected to the second panel test pad, a 2-1 circuit test lead overlapping and connected to the second substrate, a 1-1 test lead line connected to the 1-1 circuit test lead, a 1-2 test lead line connected to the 1-2 circuit test lead, and a first test lead line connected to the 2-1 circuit test lead, and the 1-1 test lead line and the 1-2 test lead line are connected to the first test lead line.
Public/Granted literature
- US20210153343A1 DISPLAY DEVICE AND AN INSPECTION METHOD OF A DISPLAY DEVICE Public/Granted day:2021-05-20
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