Invention Grant
- Patent Title: Analysis method and analysis apparatus
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Application No.: US17036825Application Date: 2020-09-29
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Publication No.: US11698336B2Publication Date: 2023-07-11
- Inventor: Kenichi Tsutsumi , Akihiro Tanaka , Kazushiro Yokouchi , Tatsuya Uchida , Noboru Taguchi , Shingo Tanaka
- Applicant: JEOL Ltd. , National Institute of Advanced Industrial Science and Technology
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.,National Institute of Advanced Industrial Science and Technology
- Current Assignee: JEOL Ltd.,National Institute of Advanced Industrial Science and Technology
- Current Assignee Address: JP Tokyo; JP Tokyo
- Agency: The Webb Law Finn
- Priority: JP 19180330 2019.09.30 JP 20084313 2020.05.13
- Main IPC: G01N21/17
- IPC: G01N21/17 ; G01N21/25

Abstract:
An analysis method includes: obtaining n×m pieces of map data by repeating, m times, a map measurement in which n pieces of map data are obtained by scanning a specimen with a primary probe to detect electrons emitted from the specimen with an electron spectrometer, while measurement energy ranges of an analyzer are varied; and generating a spectral map in which a position on the specimen is associated with a spectrum based on the n×m pieces of map data, the measurement energy ranges of m times of the map measurement not overlapping each other.
Public/Granted literature
- US20210096063A1 Analysis Method and Analysis Apparatus Public/Granted day:2021-04-01
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