Invention Grant
- Patent Title: Garbage collection in a memory component using an adjusted parameter
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Application No.: US17673408Application Date: 2022-02-16
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Publication No.: US11698742B2Publication Date: 2023-07-11
- Inventor: Jianmin Huang , Aparna U. Limaye , Avani F. Trivedi , Tomoko Ogura Iwasaki , Tracy D. Evans
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G06F12/10 ; G11C16/34 ; G11C16/24 ; G11C16/04

Abstract:
Systems, apparatuses, and methods related to media management, including “garbage collection,” in memory or storage systems or sub-systems, such as solid state drives, are described. For example, a criticality value can be determined and used as a basis for managing a garbage collection operation on a data block. A controller or the system or sub-system may determine that a criticality value associated with performing a garbage collection operation satisfies a condition. Based on determining that the condition is satisfied, a parameter associated with performing the garbage collection operation can be adjusted. The garbage collection operation is performed on the data block stored on the memory component using the adjusted parameter.
Public/Granted literature
- US20220171562A1 GARBAGE COLLECTION IN A MEMORY COMPONENT USING AN ADJUSTED PARAMETER Public/Granted day:2022-06-02
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