- 专利标题: Regression-based calibration and scanning of data units
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申请号: US17452930申请日: 2021-10-29
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公开(公告)号: US11704179B2公开(公告)日: 2023-07-18
- 发明人: Vamsi Pavan Rayaprolu , Harish R. Singidi , Ashutosh Malshe , Sampath K. Ratnam , Qisong Lin , Kishore Kumar Muchherla
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Lowenstein Sandler LLP
- 主分类号: G06F11/07
- IPC分类号: G06F11/07 ; G06F11/10 ; G06F11/30 ; G06F3/06
摘要:
Read operations can be performed to read data stored at a data block. Parameters reflective of a separation between a pair of programming distributions associated with the data block can be determined based on the plurality of read operations. A read request to read the data stored at the data block can be received. In response to receiving the read request, a read operation can be performed to read the data stored at the data block based on the parameters that are reflective of the separation between the pair of programming distributions associated with the data block.
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