Invention Grant
- Patent Title: Methods, systems, articles of manufacture and apparatus to detect code defects
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Application No.: US17483431Application Date: 2021-09-23
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Publication No.: US11704226B2Publication Date: 2023-07-18
- Inventor: Niranjan Hasabnis , Justin Gottschlich , Jeremie Dreyfuss , Amitai Armon , Itamar Ben-Ari , Oren David Kimhi
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Hanley, Flight & Zimmerman, LLC
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/36 ; G06F8/40 ; G06F8/73

Abstract:
Methods, apparatus, systems, and articles of manufacture are disclosed to detect code defects. An example apparatus includes repository interface circuitry to retrieve code repositories corresponding to a programming language of interest, tree generating circuitry to generate parse trees corresponding to code blocks contained in the code repositories, directed acyclic graph (DAG) circuitry to generate DAGs corresponding to respective ones of the parse trees, the DAGs including control flow information and data flow information, abstraction generating circuitry to abstract the DAGs, invariant identification circuitry to extract invariants from the abstracted DAGs, and DAG comparison circuitry to cluster respective ones of the extracted invariants to identify respective ones of the abstracted DAGs with common invariants.
Public/Granted literature
- US20220012163A1 METHODS, SYSTEMS, ARTICLES OF MANUFACTURE AND APPARATUS TO DETECT CODE DEFECTS Public/Granted day:2022-01-13
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