Invention Grant
- Patent Title: Manufacturing method of semiconductor structure
-
Application No.: US17687230Application Date: 2022-03-04
-
Publication No.: US11708262B2Publication Date: 2023-07-25
- Inventor: Yi-Hsien Chang , Chun-Ren Cheng , Wei-Cheng Shen , Wen-Chien Chen
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT Law
- Agent Anthony King
- The original application number of the division: US16943910 2020.07.30
- Main IPC: B81B3/00
- IPC: B81B3/00 ; B81C1/00

Abstract:
A method of manufacturing a semiconductor structure includes following operations. A first substrate is provided. A plate is formed over the first substrate. The plate includes a first tensile member, a second tensile member, a semiconductive member between the first tensile member and the second tensile member, and a plurality of apertures penetrating the first tensile member, the semiconductive member and the second tensile member. A membrane is formed over and separated from the plate. The membrane include a plurality of holes. A plurality of conductive plugs passing through the plate or membrane are formed. A plurality of semiconductive pads are formed over the plurality of conductive plugs. The plate is bonded to a second substrate. The second substrate includes a plurality of bond pads, and the semiconductive pads are in contact with the bond pads.
Public/Granted literature
- US20220185656A1 MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE Public/Granted day:2022-06-16
Information query