- 专利标题: Hybrid diffusion break with EUV gate patterning
-
申请号: US17303275申请日: 2021-05-26
-
公开(公告)号: US11710768B2公开(公告)日: 2023-07-25
- 发明人: Eric Miller , Indira Seshadri , Andrew M. Greene , Julien Frougier , Veeraraghavan S. Basker
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理商 Samuel A. Waldbaum
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L29/423 ; H01L29/786
摘要:
An apparatus including a substrate and a first nanosheet device located on the substrate. A second nanosheet device is located on the substrate, where the second nanosheet device is adjacent to the first nanosheet device. At least one first gate located on the first nanosheet device and the at least one first gate has a first width. At least one second gate located on the second nanosheet device and the at least one second gate has a second width. The first width and the second width are substantially the same. A diffusion break located between the first nanosheet device and the second nanosheet device. The diffusion break prevents the first nanosheet device from contacting the second nanosheet device, and the diffusion break has a third width. The third width is larger than the first width and the second width.
公开/授权文献
- US20220384568A1 HYBRID DIFFUSION BREAK WITH EUV GATE PATTERNING 公开/授权日:2022-12-01
信息查询
IPC分类: